@article{oai:muroran-it.repo.nii.ac.jp:00005691,
 author = {中根,  英章 and NAKANE, Hideaki and 安達,  洋 and ADACHI, Hiroshi and WALKER, M. and KLEIN, U.},
 issue = {1},
 journal = {電気学会論文誌. E, センサ・マイクロマシン部門誌},
 month = {},
 note = {application/pdf, We have used the integrated SQUID gradiometer in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. The sensor consists of a niobium dc superconducting quantum interference device (SQUID) and a first-order gradiometer pick up coil on the same substrate. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen or cryostat.},
 pages = {37--41},
 title = {Non Destructive Testing using the SQUID with Integrated Gradiometer},
 volume = {118},
 year = {1998},
 yomi = {ナカネ, ヒデアキ and アダチ, ヒロシ}
}