{"created":"2023-06-19T10:26:56.183993+00:00","id":5691,"links":{},"metadata":{"_buckets":{"deposit":"9c40ca90-971e-4d1f-a9af-85eecf5dff7f"},"_deposit":{"created_by":18,"id":"5691","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"5691"},"status":"published"},"_oai":{"id":"oai:muroran-it.repo.nii.ac.jp:00005691","sets":["216:407:277","46"]},"author_link":["8708","5759","45867","45868"],"item_79_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"41","bibliographicPageStart":"37","bibliographicVolumeNumber":"118","bibliographic_titles":[{"bibliographic_title":"電気学会論文誌. E, センサ・マイクロマシン部門誌","bibliographic_titleLang":"ja"}]}]},"item_79_description_23":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_79_description_7":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have used the integrated SQUID gradiometer in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. The sensor consists of a niobium dc superconducting quantum interference device (SQUID) and a first-order gradiometer pick up coil on the same substrate. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen or cryostat.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_79_link_17":{"attribute_name":"出版者版へのリンク","attribute_value_mlt":[{"subitem_link_text":"10.1541/ieejsmas.118.37","subitem_link_url":"https://doi.org/10.1541/ieejsmas.118.37"}]},"item_79_link_5":{"attribute_name":"室蘭工業大学研究者データベースへのリンク","attribute_value_mlt":[{"subitem_link_text":"中根 英章（NAKANE Hideaki）","subitem_link_url":"http://rdsoran.muroran-it.ac.jp/html/100000224_ja.html"}]},"item_79_publisher_11":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電気学会","subitem_publisher_language":"ja"}]},"item_79_relation_15":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10004832962","subitem_relation_type_select":"NAID"}}]},"item_79_relation_18":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1541/ieejsmas.118.37","subitem_relation_type_select":"DOI"}}]},"item_79_rights_19":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 1998 電気学会 ダウンロードを含むこの著作物の利用は、著作権法の私的使用及び引用の範囲に限り認められます。その範囲外の利用については、電気学会 の承諾が必要です。","subitem_rights_language":"ja"}]},"item_79_source_id_12":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13418939","subitem_source_identifier_type":"PISSN"}]},"item_79_source_id_14":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN1052634X","subitem_source_identifier_type":"NCID"}]},"item_79_subject_9":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"427","subitem_subject_scheme":"NDC"}]},"item_79_version_type_21":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open 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M.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"KLEIN, U.","creatorNameLang":"en"}],"familyNames":[{}],"givenNames":[{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-02-15"}],"displaytype":"detail","filename":"trieejE118_37_1998.pdf","filesize":[{"value":"2.4 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"trieejE118_37_1998.pdf","objectType":"fulltext","url":"https://muroran-it.repo.nii.ac.jp/record/5691/files/trieejE118_37_1998.pdf"},"version_id":"48f4c67c-9ef5-4b60-afa5-1ddf07ea5020"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"eddy current nondestructive testing","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"SQUID","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"integrated SQUID gradiometer","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"unshielded environment","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"multi-layer structure","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Non Destructive Testing using the SQUID with Integrated Gradiometer","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Non Destructive Testing using the SQUID with Integrated Gradiometer","subitem_title_language":"en"}]},"item_type_id":"79","owner":"18","path":["46","277"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2012-08-29"},"publish_date":"2012-08-29","publish_status":"0","recid":"5691","relation_version_is_last":true,"title":["Non Destructive Testing using the SQUID with Integrated Gradiometer"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2024-01-31T05:56:43.095388+00:00"}