{"created":"2023-06-19T10:27:05.889658+00:00","id":5925,"links":{},"metadata":{"_buckets":{"deposit":"95d34d3b-fd2e-4fdc-9d29-cff443206bb2"},"_deposit":{"created_by":18,"id":"5925","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"5925"},"status":"published"},"_oai":{"id":"oai:muroran-it.repo.nii.ac.jp:00005925","sets":["216:407:277","46"]},"author_link":["45205","5759","8708"],"item_79_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-03","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"1294","bibliographicPageStart":"1291","bibliographicVolumeNumber":"11","bibliographic_titles":[{"bibliographic_title":"IEEE transactions on applied superconductivity","bibliographic_titleLang":"en"}]}]},"item_79_description_23":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_79_description_7":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have used a high temperature superconductor (HTS) SQUID in an unshielded environment to perform eddy current nondestructive testing measurement of a multi-layer aluminum structure. The sensor consists of an YBCO dc superconducting quantum interference device (SQUID). As a demonstration of the system's capabilities, subsurface defects in a multi-layer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_79_link_17":{"attribute_name":"出版者版へのリンク","attribute_value_mlt":[{"subitem_link_text":"10.1109/77.919586","subitem_link_url":"https://doi.org/10.1109/77.919586"}]},"item_79_link_5":{"attribute_name":"室蘭工業大学研究者データベースへのリンク","attribute_value_mlt":[{"subitem_link_text":"中根 英章（NAKANE Hideaki）","subitem_link_url":"http://rdsoran.muroran-it.ac.jp/html/100000224_ja.html"}]},"item_79_publisher_11":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_79_relation_15":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"120000802224","subitem_relation_type_select":"NAID"}}]},"item_79_relation_18":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/77.919586","subitem_relation_type_select":"DOI"}}]},"item_79_rights_19":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c)2001 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. IEEE Transactions on Applied Superconductivity, vol. 11, issue 1, 2001, pp. 1291-1294","subitem_rights_language":"en"}]},"item_79_source_id_12":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10518223","subitem_source_identifier_type":"PISSN"}]},"item_79_source_id_14":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10791666","subitem_source_identifier_type":"NCID"}]},"item_79_subject_9":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"501.55","subitem_subject_scheme":"NDC"}]},"item_79_version_type_21":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"中根,  英章","creatorNameLang":"ja"},{"creatorName":"NAKANE, Hideaki","creatorNameLang":"en"},{"creatorName":"ナカネ, ヒデアキ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"KABASAWA, Ryo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"安達,  洋","creatorNameLang":"ja"},{"creatorName":"ADACHI, Hiroshi","creatorNameLang":"en"},{"creatorName":"アダチ, ヒロシ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-02-15"}],"displaytype":"detail","filename":"919586.pdf","filesize":[{"value":"694.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"919586.pdf","objectType":"fulltext","url":"https://muroran-it.repo.nii.ac.jp/record/5925/files/919586.pdf"},"version_id":"e521d608-ae7a-4306-af1b-a19c65af2d1c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Non-destructive testing using a HTS SQUID","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Non-destructive testing using a HTS SQUID","subitem_title_language":"en"}]},"item_type_id":"79","owner":"18","path":["46","277"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-08-03"},"publish_date":"2007-08-03","publish_status":"0","recid":"5925","relation_version_is_last":true,"title":["Non-destructive testing using a HTS SQUID"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-10-25T05:01:56.568167+00:00"}