{"created":"2023-06-19T10:27:09.434622+00:00","id":6010,"links":{},"metadata":{"_buckets":{"deposit":"0de7c3a4-1d66-494e-84b5-b027f9c3eedc"},"_deposit":{"created_by":18,"id":"6010","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"6010"},"status":"published"},"_oai":{"id":"oai:muroran-it.repo.nii.ac.jp:00006010","sets":["216:273","46"]},"author_link":["9587","9585","9586","45052","45053"],"item_79_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"150","bibliographicPageStart":"145","bibliographicVolumeNumber":"122","bibliographic_titles":[{"bibliographic_title":"電気学会論文誌. A, 基礎・材料・共通部門誌","bibliographic_titleLang":"ja"}]}]},"item_79_description_23":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_79_description_7":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"An efficient self-consistent Particle-in-Cell/Monte Carlo (PIC/MC) simulator for rf plasma using higher order sampling technique called Legendre Polynomial Weighted Sampling (LPWS) has been developed in this work. The spatial distributions of charged particles in a discharge space obtained by LPWS show good statistics, as compared with the conventional PIC/MC performed with the same number of super particles. Also, the spatial distribution of electric field in the discharge space calculated from those of the charged particles by solving Poisson’s equation show good statistics, so that instability of simulation caused by the fluctuation of the electric field which readily occurs in a particle model simulation of high density plasma can be inhibited by the developed simulator. Calculation time of the PIC/MC simulator coupled with LPWS is almost the same as that of the conventional PIC/MC simulator. It is found that the results obtained by the developed PIC/MC simulation have a tendency to reach the steady state condition earlier than those by the conventional PIC/MC simulator.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_79_link_5":{"attribute_name":"室蘭工業大学研究者データベースへのリンク","attribute_value_mlt":[{"subitem_link_text":"佐藤 孝紀（SATOH Kohki）","subitem_link_url":"http://rdsoran.muroran-it.ac.jp/html/100000024_ja.html"}]},"item_79_publisher_11":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電気学会","subitem_publisher_language":"ja"}]},"item_79_relation_15":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"120004681107","subitem_relation_type_select":"NAID"}}]},"item_79_rights_19":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright 2002 電気学会 ダウンロードを含むこの著作物の利用は、著作権法の私的使用及び引用の範囲に限り認められます。その範囲外の利用については、電気学会 の承諾が必要です。","subitem_rights_language":"ja"}]},"item_79_source_id_12":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03854205","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"13475533","subitem_source_identifier_type":"EISSN"}]},"item_79_source_id_14":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10136312","subitem_source_identifier_type":"NCID"},{"subitem_source_identifier":"AA12116187","subitem_source_identifier_type":"NCID"}]},"item_79_subject_9":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"427","subitem_subject_scheme":"NDC"}]},"item_79_version_type_21":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open 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博昭","creatorNameLang":"ja"},{"creatorName":"TAGASHIRA, Hiroaki","creatorNameLang":"en"},{"creatorName":"タガシラ, ヒロアキ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-02-15"}],"displaytype":"detail","filename":"trieejA122_145_2002.pdf","filesize":[{"value":"1.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"trieejA122_145_2002.pdf","objectType":"fulltext","url":"https://muroran-it.repo.nii.ac.jp/record/6010/files/trieejA122_145_2002.pdf"},"version_id":"b61260db-01f3-4b82-b7a1-f2daaa6a53d1"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"PIC/MC 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Sampling","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"B-spline","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Legendre polynomial","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Higher order sampling","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"高次のサンプリング技法を用いた効果的PIC/MC simulatorの開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高次のサンプリング技法を用いた効果的PIC/MC simulatorの開発","subitem_title_language":"ja"},{"subitem_title":"Developing an Efficient PIC/MC Simulator for RF Plasmas Using Higher Order Sampling","subitem_title_language":"en"}]},"item_type_id":"79","owner":"18","path":["46","273"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2012-08-28"},"publish_date":"2012-08-28","publish_status":"0","recid":"6010","relation_version_is_last":true,"title":["高次のサンプリング技法を用いた効果的PIC/MC simulatorの開発"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2024-02-20T01:35:29.634986+00:00"}