@article{oai:muroran-it.repo.nii.ac.jp:00007991,
 author = {栃木, 誠 and TOCHIGI, Makoto and 橋本, 幸男 and HASHIMOTO, Yukio and 野村, 滋 and NOMURA, Shigeru and 原, 進一 and HARA, Shin-ichi},
 issue = {5},
 journal = {室蘭工業大学研究報告. 理工編, Memoirs of the Muroran Institute of Technology. Science and engineering},
 month = {Nov},
 note = {application/pdf},
 pages = {783--790},
 title = {P-N接合を有する半導体デバイス中の電子ビーム誘起過剰小数キャリアの定量的解析},
 volume = {10},
 year = {1983},
 yomi = {トチギ, マコト and ハシモト, ユキオ and ノムラ, シゲル and ハラ, シンイチ}
}