@article{oai:muroran-it.repo.nii.ac.jp:00008324,
 author = {渡辺, 治夫 and WATANABE, Haruo and 小幡,  英二 and OBATA, Eiji and 向井田, 健一 and MUKAIDA, Ken-ichi},
 journal = {室蘭工業大学紀要, Memoirs of the Muroran Institute of Technology},
 month = {Nov},
 note = {application/pdf, While 3-sigma control chart in quality-control procedure takes into account only type-I error, sequential sampling plan and cumulative-sum chart are derived from the sequential analysis, developed by Wald's criteria using likelihood-ratio and both the type-I error and the type-II error. The viewpoint of hypothesis-test procedure in rejecting defective lots is introduced into the investigation of the sequential sampling inspection and the CUSUM chart. V-mask is useful to detect the change of manufacturing process with smaller samples than the samples employed in the 3-sigma control chart., 投稿論文},
 pages = {71--82},
 title = {逐次検定による逐次抜取検査と累積和管理図},
 volume = {50},
 year = {2000},
 yomi = {ワタナベ, ハルオ and オバタ, エイジ and ムカイダ, ケンイチ}
}