{"created":"2023-06-19T10:28:46.946328+00:00","id":8324,"links":{},"metadata":{"_buckets":{"deposit":"403f5158-635f-42d1-82a4-505976ce5749"},"_deposit":{"created_by":18,"id":"8324","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"8324"},"status":"published"},"_oai":{"id":"oai:muroran-it.repo.nii.ac.jp:00008324","sets":["35:174"]},"author_link":["38061","8024","38060"],"item_77_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-11-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"82","bibliographicPageStart":"71","bibliographicVolumeNumber":"50","bibliographic_titles":[{"bibliographic_title":"室蘭工業大学紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of the Muroran Institute of Technology","bibliographic_titleLang":"en"}]}]},"item_77_description_23":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_77_description_7":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"While 3-sigma control chart in quality-control procedure takes into account only type-I error, sequential sampling plan and cumulative-sum chart are derived from the sequential analysis, developed by Wald's criteria using likelihood-ratio and both the type-I error and the type-II error. The viewpoint of hypothesis-test procedure in rejecting defective lots is introduced into the investigation of the sequential sampling inspection and the CUSUM chart. V-mask is useful to detect the change of manufacturing process with smaller samples than the samples employed in the 3-sigma control chart.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_77_description_8":{"attribute_name":"注記","attribute_value_mlt":[{"subitem_description":"投稿論文","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_77_publisher_11":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"室蘭工業大学","subitem_publisher_language":"ja"}]},"item_77_relation_15":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"110000076552","subitem_relation_type_select":"NAID"}}]},"item_77_source_id_12":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13442708","subitem_source_identifier_type":"PISSN"}]},"item_77_source_id_14":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11175464","subitem_source_identifier_type":"NCID"}]},"item_77_subject_9":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"509","subitem_subject_scheme":"NDC"}]},"item_77_version_type_21":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"渡辺, 治夫","creatorNameLang":"ja"},{"creatorName":"WATANABE, Haruo","creatorNameLang":"en"},{"creatorName":"ワタナベ, ハルオ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"小幡,  英二","creatorNameLang":"ja"},{"creatorName":"OBATA, Eiji","creatorNameLang":"en"},{"creatorName":"オバタ, エイジ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"向井田, 健一","creatorNameLang":"ja"},{"creatorName":"MUKAIDA, Ken-ichi","creatorNameLang":"en"},{"creatorName":"ムカイダ, ケンイチ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-02-16"}],"displaytype":"detail","filename":"50_irai11.pdf","filesize":[{"value":"655.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"50_irai11.pdf","objectType":"fulltext","url":"https://muroran-it.repo.nii.ac.jp/record/8324/files/50_irai11.pdf"},"version_id":"804c6d1e-3688-4d85-a603-8b043eda8388"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"CUSUM chart","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"QC","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"sequential sampling inspection","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"逐次検定による逐次抜取検査と累積和管理図","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"逐次検定による逐次抜取検査と累積和管理図","subitem_title_language":"ja"},{"subitem_title":"Sequential Sampling Inspection and Cumulative Sum Chart Based on Sequential Analysis Procedure","subitem_title_language":"en"}]},"item_type_id":"77","owner":"18","path":["174"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-06-07"},"publish_date":"2007-06-07","publish_status":"0","recid":"8324","relation_version_is_last":true,"title":["逐次検定による逐次抜取検査と累積和管理図"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-12-15T03:24:20.979453+00:00"}